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Solution
? 方案(an)滿(man)足(zu)(zu)IEC61000-4-5、GBT17626.5等浪(lang)(lang)涌測試(shi)標(biao)準; ? 在(zai)差模(mo)(mo)防護(hu)(hu)中,采用(yong)(yong)鉗(qian)位器件壓(ya)敏電(dian)(dian)阻(zu)MOV,響應速度快,降(jiang)低L與N線(xian)之間的(de)浪(lang)(lang)涌電(dian)(dian)壓(ya); ? 在(zai)共模(mo)(mo)防護(hu)(hu)中,采用(yong)(yong)壓(ya)敏電(dian)(dian)阻(zu)MOV和陶瓷(ci)氣(qi)體放電(dian)(dian)管(guan)GDT串聯到PCB地或者(zhe)設備外(wai)殼,阻(zu)止壓(ya)敏電(dian)(dian)阻(zu)MOV的(de)漏電(dian)(dian)流,滿(man)足(zu)(zu)安規(gui)要(yao)求; ? 電(dian)(dian)源方案(an)可通過1.2/50-8/20μS組合(he)波差模(mo)(mo)、共模(mo)(mo)6.0KV浪(lang)(lang)涌測試(shi); PS:在(zai)有(you)絕緣等級耐壓(ya)測試(shi)AC1500V要(yao)求時,陶瓷(ci)氣(qi)體放電(dian)(dian)管(guan)GDT建議選用(yong)(yong)DC3500V電(dian)(dian)壓(ya);
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